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Keysight (Agilent) Technologies E6607-61849

KEYSIGHT (AGILENT) TECHNOLOGIES E6607-61849

EXT RF Source 3.9 GHz

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E6607-61849
EXT RF Source 3.9 GHz
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E6607-61849 PRODUCT OVERVIEW  
 

E6607A EXT wireless communications test set is an integrated one-box tester combining a vector signal analyzer, vector signal generator, innovative test sequencer, and multi-format hardware for non-signaling test. It has the capability you need to reduce manufacturing costs in today’s competitive environment. With fast measurements and flexible sequencer techniques, EXT works in synch with chipset test modes to speed calibration and verification of the latest smartphones and other wireless devices.

ast test speed

  • Executes test plans at the highest speed with the flexible EXT sequencer, measurement step times are short and individually settable, capture and measure only what you need
  • Superior measurement speed for manufacturing with multiple measurements from a single acquisition using the EXT sequencer
  • Fast measurements and flexible sequencer techniques work in synch with your device’s chipset test modes to eliminate signaling overhead from the manufacturing test process

Multiple formats

  • Fast, standards-based transmitter measurements and modulation analysis capability are based on proven Keysight X-Series signal analyzers
  • Tests new and existing radio formats including LTE, HSPA+, W-CDMA/HSPA, cdma2000®/1xEV-DO, GSM/EDGE/EDGE-EVO, WiMAXTM,Bluetooth®GPS/GNSS and more

Lowest capital investment

  • Reduces your initial capital investment with an architecture optimized for lower-cost non-signaling test
  • Preserves your investment and reduces long term costs with superior hardware, and software scalability for technology and test-mode advances

Fast test development

  • Unique, graphical Sequence Studio software dramatically simplifies test plan creation and troubleshooting reducing the need for test programming support
  • With Signal Studio and the EXT you can easily create standards-based arbitrary waveform files to test device receiver, and with today’s chipsets, to obtain synchronization to test the transmitter

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