Agilent Technologies pushes the limits of component measurements with the N7788B Component Analyzer. Its proprietary technology is comparable with the well-known Jones-Matrix-Eigenanalysis (JME) which is the standard method for measuring Polarization Mode Dispersion (PMD) or differential group delay (DGD) of optical devices.
Agilent’s new single scan technology offers a range of advantages to test a complete set of parameters:
- DGD/ PMD
- Power / Loss
- TE / TM-Loss
- 2nd-order PMD
- Principal States of Polarization (PSPs)
- Jones and Mueller Matrices
Designed for the Manufacturing Floor
High throughput: A complete analysis across the C and the L band is performed in less than 10 seconds!
Software Drivers: A range of software drivers is available for external control of the system. This allows easy integration in common ERP systems.
Remote control: Control of the instrument through LAN or via the Internet is supported. This supports automation as well as trouble shooting.
Report Generation: Generating PDF reports is supported. The content including layout is configurable by the user.
Real time power readout: High throughput measurement of non-connectorized components is supported by providinga real time power readout which enables fiber coupling of the new device.
Barcode Scanner: Using Barcode scanner is supported for quick transfer of the DUT serial number.
- Highest Accuracy in a single sweep: no averaging over multiple sweeps required
- High measurement speed
- Complete measurement across C/L-band in less than 10 seconds (no need to wait for many averages)
- Robustness against fiber movement / vibration and drift